Microhardness testing company in Chelmsford right now? A device manufacturer had a product that involved a few different boards with varying components. There were circumstances that caused the need for a change in manufacturers of one of the boards. Due to this change, the device production at this facility would be shut down until the boards from this new vendor were validated. The Quality Control department required that an inspection of the solder joints of some of the components on the board be analyzed in order to determine whether this new board manufacturer met their specifications. If the desired specifications were met and no issues were found during the inspection of the joints then production of the devices could resume.
Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.
Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.
We are proud to announce that MicroVision Labs is now accredited to the ISO/IEC 17025:2017 standard. This represents over a year of diligent effort from all of our staff to verify and validate our in house SOP’s and transform our quality management system to one that is compliant to this international standard. This certification requires that accredited labs demonstrate that they are competent and can produce technically valid data and results unlike other certifications such as ISO 9001:2015. This represents an obvious value to our clients. Discover a few more details at Microvision labs microscopy services.
Do you give lab tours? Yes, we routinely give lab tours to our clients and potential clients. Please call and we would be happy to schedule a tour for you and your co-workers. Do you have other locations around the country? We do work for companies all across the United States, with one laboratory which is located in Chelmsford, Massachusetts. Did MicroVision Labs ever operate under a different company name? No, we have always been MicroVision Laboratories, Inc. Our founder, John Knowles, used to work for another laboratory that underwent several name changes (Eastern Analytical Laboratories, Industrial Environmental Analysts, American Environmental Network, Severn Trent Laboratories, and EMLab P&K Billeria) and was located nearby in Billerica. When that laboratory was closed in 2008, John hired a few of the remaining analysts and acquired its equipment, client list and phone number.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Discover a few more details on https://microvisionlabs.com/.