Microscopy laboratories in Chelmsford near me

Particle size analysis providers with MicroVision Laboratories 2021? Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin.

Analysis and Results: The submitted bottle was examined for signs of interior distress, and the water from the bottle was removed and maintained. Some of the suspended particulate was filtered and examined non-destructively by light microscopy first, to characterize the material. A low magnification stereo microscope image of the filtered white particulate is shown in the image above. From this image, biological tissues were ruled out, and the material was observed to be crystalline. Polarized light microscopy (PLM) was used to analyze the sample next. From this examination, the material showed birefringence as shown in the PLM image on the right. The PLM Image Stereo Microscope image suspect material showed optical properties and morphology dissimilar to common carbonates and sulfates. It was determined to be a birefringent crystalline material, but it could not be identified using only PLM methods. Therefore, analysis using scanning electron microscopy with energy dispersive x-ray spectroscopy (SEM-EDS) would have to be performed to obtain further information about the suspect material.

Dust samples were analyzed using polarized light microscopy (PLM) to provide percentages of the particle types present in the samples. MVL was able to determine that there was significant loading of glass fibers in the dust samples with the likely source being contractor’s work in the attic which involved disturbing the fiberglass insulation. The image on the right shows a few distinct glass fibers with a binder material adhered to them, consistent with fiberglass insulation.

MicroVision Labs is owned and operated by a career microscopist, John Knowles, who understands the needs of our clients. Our emphasis on helping our clients solve problems, not just providing data, sets us apart from other labs. We have the technology and knowledge to find answers to your most difficult challenges, helping you succeed at every step. Can I come in to see my samples analyzed? Yes, our clients are always welcome to come in while their samples are being analyzed. For much of the work we do, it is mutually beneficial for our clients to be present to help direct their project since they can provide expertise about their samples. Some of the services we provide such as polished cross sections have time consuming steps making it impractical for a client to stay to watch everything. In those cases it is recommended that you come in initially to explain what you need done and come back at a later time to see the finished product. Find a few extra info at https://microvisionlabs.com/service/eds-elemental-analysis/.

Do you do any animal testing? No. Do you analyze any tissue samples or blood samples? No. We do not do any blood analyses and we are not set up to prepare tissue samples. What are some of the cool samples you have looked at under the scanning electron microscope? We have seen 10,000 year old Wolly Mammoth hair, meteorites, an artificial heart valve, civil war bullets, insulin pumps, rare colonial coins, a kidney stone, and a few things we can’t talk about. But some of the more mundane samples, like wood or salt crystals, have proven to be extremely interesting subjects to image.

SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. Read additional details on https://microvisionlabs.com/.